The Lasea LS-Profile is available in two specialised variants, each targeting a distinct stage of laser beam characterisation:
LS-Profile Beam — Optical Path Analysis
Measures beam characteristics along the optical path, including beam diameter, divergence, and M² factor. Used to verify beam quality from the laser source through to the final focusing optic.
LS-Profile Spot — Focal Plane Analysis
Characterises the focused spot at the workpiece surface — measuring spot size, shape, and position. Essential for verifying that the focused beam delivers the expected spatial characteristics at the point of material interaction.
Both variants integrate with LASEA’s micromachining platforms and can be used during system commissioning, process development, post-maintenance verification, and routine QA. Measurements are repeatable and non-destructive — no interruption to the machining process is required.W