The Si-Ware NeoSpectra Micro Spectral FT-IR Sensor is the world’s sensor based on monolithic MEMS technology. The NeoSpectra Micro Spectral features an integrated spectral sensor for use in various material sensing applications for qualification and quantification. Si-Ware’s sensor offers performance comparable to laboratory-based spectrometers, but at a dramatically smaller size and lower cost.
The NeoSpectra devices are based on a full Michel interferometer that is realised on a MEMS chip. A MEMS oscillating mirror represents the movable arm of the interferometer. From the coupled light arises an interferogram on the InGAs photodetector, from which the spectrum is calculated via Fourier-Transformation.
In addition to the MEMS chip and InGaAs photodetector, the Micro contains several ASICs for device control and data processing, as well as an optical head. This already consists of an complete illumination unit and coupling optics, which are designed for reflection measurements. Customized optical heads can be developed.
NeoSpectra-Micro Development Kit
The Development Kit is a plug-and-play solution to allow working directly with the NeoSpectra Micro. This accelerates the learning process and enables you to quickly start developing your own application. It consists of the test board to which the NeoSpectra Micro is soldered and which can be addressed via PINs on the bottom using SPI commands. Screwed onto the supplied Raspberry Pi, the NeoSpectra Micro can be connected to a computer or operated independently. The SpectroMOST test software is supplied for both computer and Raspberry Pi in order to use the sensor directly.
Wavelength range 1250 – 2500 nm
16nm resolution
Signal to Noise ratio >2,000:1 @ 2,350 nm
Accuracy/Repeatability ± 1.5 nm / ± 0.15 @ 1,400 nm
Technical Specifications
| Parameter | Conditions | Value | Units |
| Wavelength Range | PSD*> max PSD/10 | 1,350 – 2,500 | nm |
| Resolution | At λ = 1,550 nm, FWHM criterion | 16 | nm |
| Typical SNR (rms) | 2s Scan time, @λ = 2,350 nm | 2,000 : 1 | – |
| Temperature | Operation | -5 : 40 | °C |
| Wavelength Accuracy | @λ = 1,400 nm; temperature < 40° C | ±1.5 | nm |
| Wavelength Repeatability | @λ = 1,400 nm; absorbance level= 0.5 AU | ±01 | nm |
Moisture content measurements of liquids, solid materials and powders for process and quality control
Identification of faked materials, such as the differentiation of silk, wool, cotton, elastane, etc.
Quantitative measurements of the composition of food or feed, e.g. the content of fat, protein and lactose of milk.
Characterization of plastics, e.g. via polymer identification such as polyethylene, polypropylene, polyvinylchloride etc.
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Photonic Solutions Ltd
Unit 2.2 Quantum Court
Heriot-Watt University Research Park
Edinburgh
EH14 4AP
