S-Series Fizeau Interferometers

The ÄPRE S-Series Fizeau Interferometers are built for optical shops that need reliable, high-resolution surface and wavefront measurement without compromise on speed or accuracy. The diffraction-limited optical design is camera-matched to maximise imaging resolution, while the large virtual zoom delivers flexibility across different test configurations without loss of fringe contrast or aberration performance.

Interchangeable transmission flats and spheres provide unmatched flexibility for testing different optical geometries. All S-Series systems run REVEAL, ÄPRE’s proprietary metrology software, which delivers powerful data analysis, real-time visualisation, and automated reporting — with free lifetime upgrades included as standard.

STANDARD EQUIPMENT
Camera-limited diffraction-limited Fizeau optical design
Apertures: 50, 100, 150 mm (S300 for 300 mm)
1MP or 4MP camera (model dependent)
Interchangeable transmission flats and spheres
REVEAL metrology software — free lifetime upgrades
HeNe laser source standard; SCI and ÄTLas 633 tunable laser available as options

AVAILABLE VARIANTS
S50, S100, S150 | 1MP — 50, 100, 150 mm apertures
S50, S100, S150 | 4MP — 50, 100, 150 mm apertures
S300 | 4MP — 300 mm aperture
S50, S100, S150 NIR — 1053 nm & 1064 nm wavelengths
S50, S150 LWIR — 9.27 µm to 10.6 µm wavelengths

S Series | 1MP

S Series | 4MP

• Optical Shop Testing
  • Surface and transmitted wavefront measurement of flats, spheres, lenses, mirrors, and prisms across production and R&D settings.
• Precision Optics Manufacturing & Final Inspection
  • High-resolution measurement for process control and final acceptance testing in precision optics fabrication.
• CNC Spot Polishing Process Control
  • In-process surface measurement to guide and verify polishing corrections. High-quality reference optics suited to smooth reference surface requirements.
• High-Reflectivity & IR Optics
  • NIR and LWIR variants enable measurement of optics at 1053 nm, 1064 nm, and 9.27–10.6 µm — including mirrors, substrates, and optical elements outside the standard HeNe range.
• R&D Metrology
  • Flexible aperture and source options support a wide range of research applications in academic and industrial laboratories.