Quantum Efficiency and IPCE Measurement Systems

Quantum efficiency measurement systems allow users to quantify the performance of photovoltaic cells. Quantum efficiency focuses on the proportion of the incident photons applied to the cell that are successfully collected.

The measurements that are included in standard systems are:
– Current-Voltage (I-V) Testing. VOC , ISC, Rshunt, Pmax, efficiency %, and fill factor
– Spectral Response (SR): 250-2500nm or 300-5000nm range
– External Quantum Efficiency (EQE) | (IPCE)
– Internal Quantum Efficiency (IQE Test)
– Reflectance and transmittance measurements

The optional upgrades include:
– Constant Photocurrent method (CPM)
– Dual-Beam Photocurrent (DBM)
– Photothermal Deflection Spectroscopy (PDS)
– Steady-State Photoconductivity (SSPC)
– Temperature Control
– DC measurement

• Spectral range 250 to 2500nm
• Monochromatic light power up to 125mW total
• Keithley 2400 series source meter (measurement of large-capacitance solar cell is possible)
• Stanford SR800 series lock-in amplifier
• User-selectable bias voltage
• Light-tight measurement chamber
• DC mode measurement capability (optional)

<td>0.4-48 nm with 600 l/mm blazed @ 500 nm 0.8-96 nm with 300 l/mm blazed @ 2000 nm 1.6-192 nm with 150 l/mm blazed @ 5400 nm

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t;Tunable Light Source150 W Xenon short arc lamp (1200 hour lifetime) and /or 250 W QTH lamp (average 50 hour lifetime)Xe short arc lampXe+QTH lamp

Tuning/scanning range250-2500 nm300-5000 nm</td>1/4 m Czerny-Turner monochromator with an adjustable bandpass and motorised triple grating turret system (3 gratings):0.2-24 nm with 1200 l/mm blazed @ 250 nm 0.2-24 nm with 1200 l/mm blazed @ 500 nm 0.4-48 nm with 600 l/mm blazed @1000 nmAdjustable beam size/td>0.5-2.4 mm diameter at focal plane with standard opticsHard-coated order sorting filtersIncludedBias Light Source150 W or 300 W Xenon short arc lamp, average lifetime 1200 hours for 150 W, 900 hours for 300 W.Optional: 150 W with Standard Sample Chamber OR 300 W with Extended Sample Chamber25 × 25 or 50 × 50 mm AAA, (ASTM E927-19) Solar SimulatorIncludes mounted AM1.5G filter + additional filter slotReference DetectorIncludes mounted AM1.5G filter + additional filter slotIncludedCalibrated range250-2500nm300-5000nmIQE Measurement System50 mm integrating sphereOptional, available as an add-onInternal quantum efficiency measurement determined from material reflectance measurement (hardware included) 250-2500 nm range.Measurement SystemSource MeterOPtionalLock-In AmplifierIncludedChopper 4-200HzIncludedStandard Auto Time Constant FeatureIncludedTemperature Control (10-60 °C)Accessory AvailableAC and DC Measurement ModeIncludedSample PlacementSample spacer for proper placement of the sample under the monochromatic and bias light beamA simple 50 × 50 mm sample spacer is included, and various cell chucks are available as add-ons. Includes electrical connectionsSoftware and InterfaceModern software written in .NET (Windows 11 Operating System)SciPV IncludedData files and automation log exportable as ASCIIYesPre-configured and tested control computer includedYesBuilt-in microcontroller switches and monitors signals automaticallyIncluded1 USB PortUSB-B Interface1 IEC 60320 C14 power entry inletYesComplianceIntended for use in measurements according to ASTM E 1021-15 , ASTM E948, IEC 60904-8, IEC 60904-1YesPower SystemSingle phase, configurable for 240 VAC, 50 Hz or 120 VAC, 60 HzYes

• Photovoltaic Solar Cell Testing
• IV measurement
• Spectral response measurement (SR)
• External quantum efficiency (EQE)/incident photon-to-current efficiency (IPCE) measurement
• Internal quantum efficiency measurement (IQE)
• Photoconductivity Measurement
• Reflectance and Transmittance Measurements Capability